Document Type

Article

Version

Final Published Version

Publication Title

Journal of Applied Crystallography

Volume

51

Issue

1

First Page

27

Last Page

34

Publication Date

2018

Abstract

Invisible on a scanning electron microscope image of the surface of an Ethiopian opal rough fracture, a periodic arrangement was detected by fast Fourier transform. Using a mask to eliminate the continuous background and keeping only the bright spots in the reciprocal space (fast Fourier transform pattern), an image reconstructed by inverse fast Fourier transform (IFFT) emphasizes a very regular bidisperse array. Taken on a vicinal plane, the image of the successive steps of the stacking allows identification of the crystallographic structure and estimation of the parameters of this aluminium diboride-type photonic crystal. In addition, another more complex IFFT image allowed confirmation of the structure and determination of the crystallographic indexing of the steps, despite image deformation due to the tilt of the vicinal plane under the electron beam.

DOI

https://doi.org/10.1107/S1600576717016387

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